Quantum metrology

Results: 45



#Item
21Hall effect / Nanomaterials / Quantum mechanics / Cryogenic current comparator / Graphene / Quantum Hall effect / Fractional quantum Hall effect / Metrology / 2DEG / Physics / Quantum phases / Condensed matter physics

T4.J04 ULQHE Publishable JRP Summary for Project T4.J04 ULQHE Enabling ultimate metrological quantum Hall effect (QHE) devices

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Source URL: www.euramet.org

Language: English - Date: 2010-06-22 05:05:43
22Superconductivity / Sensors / Measuring instruments / Electronic test equipment / Josephson effect / Voltage reference / Volt / Metrology / Audio power / Physics / Electromagnetism / Measurement

T´4.J03 JRP JOSY JRP LOGO (optional) Publishable JRP Summary for Project T4 J03 JOSY Next generation of quantum voltage systems for wide range

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Source URL: www.euramet.org

Language: English - Date: 2010-03-30 06:03:47
23Innovation / Joint Quantum Institute / Science / Physics / Structure / Advanced Technology Program / America COMPETES Act / Gaithersburg /  Maryland / National Institute of Standards and Technology / Metrology

Testimony of Patrick D. Gallagher, Ph.D. Under Secretary of Commerce for Standards and Technology United States Department of Commerce

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Source URL: www.nist.gov

Language: English - Date: 2013-06-14 11:48:06
24Standards / Science / Spectroscopy / Scientific method / Knowledge / X-ray fluorescence / Calibration / Measurement / Metrology

7.3. HSI Quantum Efficiency Measurements[removed]October 1998

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Source URL: cxc.harvard.edu

Language: English - Date: 2011-02-17 16:30:11
25Joint Quantum Institute / American Competitiveness Initiative / Metrology / Nanometrology / Physics / United States / Government / Gaithersburg /  Maryland / National Institute of Standards and Technology / Advanced Technology Program

Testimony of Dr. William Jeffrey National Institute of Standards and Technology Technology Administration U.S. Department of Commerce

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Source URL: www.nist.gov

Language: English - Date: 2010-09-17 11:26:18
26Innovation / Joint Quantum Institute / Science / Physics / Structure / Advanced Technology Program / America COMPETES Act / Gaithersburg /  Maryland / National Institute of Standards and Technology / Metrology

Testimony of Patrick D. Gallagher, Ph.D. Under Secretary of Commerce for Standards and Technology United States Department of Commerce

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Source URL: www.nist.gov

Language: English - Date: 2013-06-14 11:48:27
27Joint Quantum Institute / Advanced Technology Program / American Competitiveness Initiative / Metrology / Nanometrology / William Jeffrey / Physics / United States / Government / Gaithersburg /  Maryland / National Institute of Standards and Technology / Quantum mechanics

Testimony of Dr. William Jeffrey Director National Institute of Standards and Technology Technology Administration U.S. Department of Commerce

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Source URL: www.nist.gov

Language: English - Date: 2010-08-30 15:12:12
28Joint Quantum Institute / American Competitiveness Initiative / Metrology / Nanometrology / Physics / United States / Government / Gaithersburg /  Maryland / National Institute of Standards and Technology / Advanced Technology Program

Microsoft Word - WJeffrey Senate Approps FY08 Budget[removed]doc

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Source URL: www.nist.gov

Language: English - Date: 2010-09-17 11:26:46
29Joint Quantum Institute / William Jeffrey / Metrology / Competitiveness / American Competitiveness Initiative / Innovation / Kilogram / Science / Physics / Gaithersburg /  Maryland / National Institute of Standards and Technology / Measurement

William Jeffrey, Director

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Source URL: www.nist.gov

Language: English - Date: 2010-09-17 11:28:47
30Advanced Technology Program / Joint Quantum Institute / American Competitiveness Initiative / Metrology / Nanometrology / Physics / United States / Measurement / Standards organizations / Gaithersburg /  Maryland / National Institute of Standards and Technology

Testimony of Dr. William Jeffrey National Institute of Standards and Technology Technology Administration U.S. Department of Commerce

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Source URL: www.nist.gov

Language: English - Date: 2010-08-30 15:16:59
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